High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
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- Synopsis
- This book introduces a novel framework for accurately modeling the errors in nanoscale technology and developing a smooth tool flow at high-level design abstractions to estimate error effects, which aids the development of high-level fault-tolerant techniques. In total, the book presents 6 solutions for reliability estimation (3 for fault injection and 3 for analytical estimation) and 5 techniques for reliability exploration (3 for architectural level and 2 for system-level). It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
- Copyright:
- 2017
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9789811010736
- Publisher:
- Springer Singapore, Singapore
- Date of Addition:
- 06/23/17
- Copyrighted By:
- Springer
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
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