Magnetic Resonance of Semiconductors and Their Nanostructures: Basic and Advanced Applications (1st ed. 2017) (Springer Series in Materials Science #253)

By: Pavel G. Baranov and Hans Jürgen Bardeleben and Fedor Jelezko and Jörg Wrachtrup

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Synopsis: Different magnetic resonance (MR) methods and their applications in solids (e. g. semiconductors and nanostructures) are the focus of this work. Techniques and combinations thereof are explained and used to analyze defects in semiconductors and nanostructures. Presented for the first time are novelties such as single defects MR as well as state-of-art high-frequency pulse methods: EPR, ODMR, ENDOR. An overview of MR methods currently used to study defects, such as electron paramagnetic resonance (EPR), optically detected magnetic resonance (ODMR), electron-nuclear double resonance (ENDOR) etc. is provided. Problems existing in semiconductor and nanotechnology sciences which are resolved by MR are given. The past and current state and perspectives of application of MR are provided with emphasis on advances in MR methods. Intended for researchers in MR studies of semiconductors and nanostructures wanting a comprehensive review of what has been done in their and related fields of studies as well as future perspectives.