VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers (1st ed. 2019) (Communications in Computer and Information Science #1066)

By: Rohit Sharma and Virendra Singh and Sudeb Dasgupta and Anirban Sengupta and Santosh Kumar Vishvakarma

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Synopsis: This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Book Quality:: Publisher Quality
ISBN-13:: 9789813297678
Related ISBNs:: 9789813297661
Publisher:: Springer Singapore, Singapore
Date of Addition:: 09/14/19
Copyrighted By:: Springer
Adult content:: No
Language:: English
Has Image Descriptions:: No
Categories:: Nonfiction, Art and Architecture, Computers and Internet, Mathematics and Statistics, Philosophy
Submitted By:: Bookshare Staff
Usage Restrictions:: This is a copyrighted book.
Edited by:: Santosh Kumar Vishvakarma
Edited by:: Rohit Sharma
Edited by:: Virendra Singh
Edited by:: Sudeb Dasgupta
Edited by:: Anirban Sengupta