Measurement Technology for Micro-Nanometer Devices

By: and and and and and and and and

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Synopsis
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale• Highlights the advanced research work from industry and academia in micro-nano devices test technology• Written at both introductory and advanced levels, provides the fundamentals and theories• Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Copyright:
2016

Book Details

Book Quality:
Publisher Quality
Book Size:
352 Pages
ISBN-13:
9781118717998
Related ISBNs:
9781118717967, 9781118717974
Publisher:
Wiley
Date of Addition:
Copyrighted By:
National Defense Industry Press
Adult content:
No
Language:
English
Has Image Descriptions:
No
Categories:
Nonfiction, Technology
Submitted By:
Bookshare Staff
Usage Restrictions:
This is a copyrighted book.

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