Thermal Conductivity Measurements in Atomically Thin Materials and Devices (1st ed. 2020) (SpringerBriefs in Applied Sciences and Technology)
By:
Sign Up Now!
Already a Member? Log In
You must be logged into Bookshare to access this title.
Learn about membership options,
or view our freely available titles.
- Synopsis
- This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.
- Copyright:
- 2020
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9789811553486
- Related ISBNs:
- 9789811553479
- Publisher:
- Springer Singapore, Singapore
- Date of Addition:
- 05/20/20
- Copyrighted By:
- Springer
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.