Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies (1st ed. 2020)

By: and and

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Synopsis
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.
Copyright:
2020

Book Details

Book Quality:
Publisher Quality
ISBN-13:
9783030415365
Related ISBNs:
9783030415358
Publisher:
Springer International Publishing
Date of Addition:
Copyrighted By:
Springer
Adult content:
No
Language:
English
Has Image Descriptions:
No
Categories:
Nonfiction, Technology
Submitted By:
Bookshare Staff
Usage Restrictions:
This is a copyrighted book.

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