System Dependability and Analytics: Approaching System Dependability from Data, System and Analytics Perspectives (1st ed. 2023) (Springer Series in Reliability Engineering)

By: Long Wang and Karthik Pattabiraman and Catello Di Martino and Arjun Athreya and Saurabh Bagchi

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Synopsis: This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics. The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008–2011. The book contains chapters written by many of his former students.

Book Quality:: Publisher Quality
ISBN-13:: 9783031020636
Related ISBNs:: 9783031020629
Publisher:: Springer International Publishing
Date of Addition:: 08/26/22
Copyrighted By:: The Editor
Adult content:: No
Language:: English
Has Image Descriptions:: No
Categories:: Nonfiction, Business and Finance, Technology, Mathematics and Statistics
Submitted By:: Bookshare Staff
Usage Restrictions:: This is a copyrighted book.
Edited by:: Long Wang
Edited by:: Karthik Pattabiraman
Edited by:: Catello Di Martino
Edited by:: Arjun Athreya
Edited by:: Saurabh Bagchi