Thermal-Aware Testing of Digital VLSI Circuits and Systems
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- Synopsis
- This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
- Copyright:
- 2018
Book Details
- Book Quality:
- Publisher Quality
- Book Size:
- 118 Pages
- ISBN-13:
- 9781351227766
- Related ISBNs:
- 9781351227780, 9780815378822, 9780367607098
- Publisher:
- CRC Press
- Date of Addition:
- 12/07/23
- Copyrighted By:
- Taylor & Francis Group, LLC
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.