Semiconductor X-Ray Detectors (ISSN #12)
By: and
Sign Up Now!
Already a Member? Log In
You must be logged into Bookshare to access this title.
Learn about membership options,
or view our freely available titles.
- Synopsis
- Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its
- Copyright:
- 2014
Book Details
- Book Quality:
- Publisher Quality
- Book Size:
- 624 Pages
- ISBN-13:
- 9781040056622
- Related ISBNs:
- 9780429088247, 9781466554009, 9781138033856, 9780367826451, 9781466554016
- Publisher:
- CRC Press
- Date of Addition:
- 06/14/24
- Copyrighted By:
- Taylor & Francis Group, LLC
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.