Defects in Microelectronic Materials and Devices

By: and and

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Synopsis
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
Copyright:
2009

Book Details

Book Quality:
Publisher Quality
ISBN-13:
9781040078501
Related ISBNs:
9780429190919, 9780367386399, 9781420043778, 9781420043761
Publisher:
CRC Press
Date of Addition:
Copyrighted By:
Taylor & Francis Group, LLC
Adult content:
No
Language:
English
Has Image Descriptions:
No
Categories:
Nonfiction, Science, Technology
Submitted By:
Bookshare Staff
Usage Restrictions:
This is a copyrighted book.
Edited by:
Daniel M. Fleetwood
Edited by:
Ronald D. Schrimpf

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