Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science)

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Synopsis
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Copyright:
2000

Book Details

Book Quality:
Publisher Quality
ISBN-13:
9781040205860
Related ISBNs:
9780750307482, 9780429137884, 9781420034646
Publisher:
CRC Press
Date of Addition:
Copyrighted By:
Taylor & Francis Group, LLC
Adult content:
No
Language:
English
Has Image Descriptions:
No
Categories:
Nonfiction, Science, Medicine
Submitted By:
Bookshare Staff
Usage Restrictions:
This is a copyrighted book.

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