Atomic Force Microscopy in Adhesion Studies (1)
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- Synopsis
- Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an
- Copyright:
- 2005
Book Details
- Book Quality:
- Publisher Quality
- Book Size:
- 600 Pages
- ISBN-13:
- 9781040192306
- Related ISBNs:
- 9789047416463, 9780429087295, 9789067644341
- Publisher:
- CRC Press
- Date of Addition:
- 01/26/25
- Copyrighted By:
- Taylor & Francis Group, LLC
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- null J. Drelich
- Edited by:
- null Kash L. Mittal