Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK (1) (Institute of Physics Conference Series)
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- Synopsis
- With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigat
- Copyright:
- 1999
Book Details
- Book Quality:
- Publisher Quality
- Book Size:
- 774 Pages
- ISBN-13:
- 9781040076781
- Related ISBNs:
- 9781482268690, 9780750306508, 9780429176135
- Publisher:
- CRC Press
- Date of Addition:
- 01/26/25
- Copyrighted By:
- IOP Publishing Ltd and individual contributors.
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- null A.G Cullis
- Edited by:
- null R Beanland