Fundamentals of Electromigration-Aware Integrated Circuit Design (Second Edition 2025)
By: and and
Sign Up Now!
Already a Member? Log In
You must be logged into Bookshare to access this title.
Learn about membership options,
or view our freely available titles.
- Synopsis
- The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
- Copyright:
- 2025
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783031800238
- Related ISBNs:
- 9783031800221
- Publisher:
- Springer Nature Switzerland
- Date of Addition:
- 03/29/25
- Copyrighted By:
- The Editor
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
Reviews
Other Books
- by Jens Lienig
- by Susann Rothe
- by Matthias Thiele
- in Nonfiction
- in Computers and Internet
- in Technology